[IEEE 2010 International Conference on Microelectronic Test...

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[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Characterization & modeling of gate-induced-drain-leakage with complete overlap and fringing model

Rideau, D., Quenette, V., Garetto, D., Dornel, E., Weybright, M., Manceau, J. P, Saxod, O., Tavernier, C., Jaouen, H.
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Year:
2010
Language:
english
DOI:
10.1109/ICMTS.2010.5466816
File:
PDF, 204 KB
english, 2010
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