Experimental Characterization and Analysis of an...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2012 / 02 Vol. 20; Iss. 2

Experimental Characterization and Analysis of an Asynchronous Approach for Reduction of Substrate Noise in Digital Circuitry

Le, Jim, Hanken, Christopher, Held, Martin, Hagedorn, Michael S., Mayaram, Kartikeya, Fiez, Terri S.
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Volume:
20
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2010.2100835
Date:
February, 2012
File:
PDF, 1.80 MB
english, 2012
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