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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A 1-GS/s CMOS 6-bit flash ADC with an offset calibrating method
Chih-Hsiang Chang,, Chih-Yi Hsiao,, Ching-Yuan Yang,Year:
2008
Language:
english
DOI:
10.1109/VDAT.2008.4542455
File:
PDF, 612 KB
english, 2008