SPIE Proceedings [SPIE 6th International Symposium on...

SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - A measurement system of atmospheric refractive index structure parameter based on solar power device

Zhao, Junwei, Qiang, Xiwen, Zhang, Zhigang, Feng, Shuanglian, Hu, Yuehong, Jiang, Yadong, Yu, Junsheng, Wang, Zhifeng

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Volume:

8419

Year:

2012

Language:

english

DOI:

10.1117/12.975652

File:

PDF, 257 KB

english, 2012

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