SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California (Sunday 23 January 2011)] Image Processing: Machine Vision Applications IV - Non-parametric texture defect detection using Weibull features
Timm, Fabian, Barth, Erhardt, Fofi, David, Bingham, Philip R.Volume:
7877
Year:
2011
Language:
english
DOI:
10.1117/12.872463
File:
PDF, 5.01 MB
english, 2011