[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Parameter analysis and reader architectures for broadband 13.56 MHz RFID systems
Gossar, M., Witschnig, H., Enzinger, H.Year:
2010
Language:
english
DOI:
10.1109/MWSYM.2010.5517624
File:
PDF, 1.10 MB
english, 2010