Low resistance ohmic contacts on AlGaN/GaN structures using implantation and the âadvancingâ Al/Ti metallization
Qiao, D., Guan, Z. F., Carlton, J., Lau, S. S., Sullivan, G. J.Volume:
74
Year:
1999
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.123927
File:
PDF, 404 KB
english, 1999