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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on near-field scattering characteristic based on ray-tracing
Wu, Kaifeng, Ma, Jing, Mao, Hongxia, Dong, Yanbing, Zhang, Yudong, Xiang, Libin, To, SandyVolume:
8417
Year:
2012
Language:
english
DOI:
10.1117/12.977637
File:
PDF, 436 KB
english, 2012