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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Uncertainty analysis of solar simulator's spectral irradiance measurement
Meng, Haifeng, Xiong, Limin, He, Yingwei, Liu, Dingpu, Zhang, Jieyu, Li, Wenxin, Jiang, Yadong, Yu, Junsheng, Wang, ZhifengVolume:
8419
Year:
2012
Language:
english
DOI:
10.1117/12.971190
File:
PDF, 930 KB
english, 2012