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[IEEE 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Zurich, Switzerland (2009.01.12-2009.01.16)] 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Detecting the Number of EMI Sources Based on Higher Order Statistics
Zhenfei, Song, Donglin, Su, Shuguo, XieYear:
2009
Language:
english
DOI:
10.1109/EMCZUR.2009.4783491
File:
PDF, 3.31 MB
english, 2009