Comparing the kinetics of bias stress in organic field-effect transistors with different dielectric interfaces
Ng, Tse Nga, Marohn, John A., Chabinyc, Michael L.Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2358410
File:
PDF, 691 KB
english, 2006