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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - High-frequency optical fiber microphone for condition-based maintenance application
Tosi, Daniele, Lehmann, Peter H., Osten, Wolfgang, Olivero, Massimo, Perrone, Guido, Albertazzi, Armando, Vallan, AlbertoVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2019249
File:
PDF, 563 KB
english, 2013