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A correction method of matrix, density and thickness effects in thin samples analysed by X-ray fluorescence spectrometry
Frigieri, P., Rossi, F., Trucco, R.Volume:
35
Language:
english
Journal:
Spectrochimica Acta Part B: Atomic Spectroscopy
DOI:
10.1016/0584-8547(80)80073-5
Date:
January, 1980
File:
PDF, 990 KB
english, 1980