The emergent scaling phenomenon and the dielectric properties of random resistor–capacitor networks
Bouamrane, R, Almond, D PVolume:
15
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/15/24/302
Date:
June, 2003
File:
PDF, 363 KB
english, 2003