Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?
Montgomery, Paul C., Serio, Bruno, Anstotz, Freddy, Montaner, DenisVolume:
281
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2013.02.029
Date:
September, 2013
File:
PDF, 1.69 MB
english, 2013