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Linear Drain Current Degradation of ps-LDMOS Transistor Under ${\rm I}_{\rm submax}$ and ${\rm I}_{\rm gmax}$ Stress
Sun, Weifeng, Liu, Siyang, Huang, Tingting, Zhang, ChunweiVolume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2013.2260718
Date:
August, 2013
File:
PDF, 599 KB
english, 2013