[IEEE 2006 International Electron Devices Meeting - San...

  • Main
  • [IEEE 2006 International Electron...

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Impact of Stochastic Mismatch on Measured SRAM Performance of FinFETs with Resist/Spacer-Defined Fins: Role of Line-Edge-Roughness

Dixit, A., Anil, K. G., Baravelli, E., Roussel, P., Mercha, A., Gustin, C., Bamal, M., Grossar, E., Rooyackers, R., Augendre, E., Jurczak, M., Biesemans, S., De Meyer, K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/IEDM.2006.346884
File:
PDF, 278 KB
english, 2006
Conversion to is in progress
Conversion to is failed