![](/img/cover-not-exists.png)
[IEEE 2005 18th Symposium on Integrated Circuits and Systems Design - (2005.09.4-2005.09.7)] 2005 18th Symposium on Integrated Circuits and Systems Design - Evaluating Fault Coverage of Bulk Built-in Current Sensor for Soft Errors in Combinational and Sequential Logic
Neto, Egas Henes, Ribeiro, Ivandro, Vieira, Michele, Wirth, Gilson, Kastensmidt, Fernanda LimaYear:
2005
Language:
english
DOI:
10.1109/SBCCI.2005.4286833
File:
PDF, 2.08 MB
english, 2005