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Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection
Neto, Egas Henes, Kastensmidt, Fernanda Lima, Wirth, GilsonVolume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.920426
Date:
August, 2008
File:
PDF, 847 KB
english, 2008