[IEEE 2010 IEEE 16th International On-Line Testing...

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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Predictive error detection by on-line aging monitoring

Vazquez, J. C., Champac, V., Ziesemer, A. M., Reis, R., Semiao, J., Teixeira, I. C., Santos, M. B., Teixeira, J. P.
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Year:
2010
Language:
english
DOI:
10.1109/IOLTS.2010.5560241
File:
PDF, 944 KB
english, 2010
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