Residual stress in coated low-z films of TiC and TiN: II. correlation of residual stress with microstructure
Isao Yoshizawa, Zensaburo Kabeya, Kohji KamadaVolume:
123
Year:
1984
Language:
english
Pages:
5
DOI:
10.1016/0022-3115(84)90261-7
File:
PDF, 887 KB
english, 1984