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[IEEE 2009 73rd ARFTG Microwave Measurement Conference (ARFTG) - Boston, MA, USA (2009.06.12-2009.06.12)] 2009 73rd ARFTG Microwave Measurement Conference - Nonlinear validation of arbitrary load X-parameter and measurement-based device models
Gunyan, Daniel, Horn, Jason, Xu, Jianjun, Root, David E.Year:
2009
Language:
english
DOI:
10.1109/ARFTG.2009.5278063
File:
PDF, 5.32 MB
english, 2009