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[IEEE 2010 3rd International Congress on Image and Signal Processing (CISP) - Yantai, China (2010.10.16-2010.10.18)] 2010 3rd International Congress on Image and Signal Processing - Heuristic Bayesian pixel classification for power line inspection
Du, Shengzhi, van Wyk, Barend Jacobus, Tu, ChunlingYear:
2010
Language:
english
DOI:
10.1109/CISP.2010.5646922
File:
PDF, 186 KB
english, 2010