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The thermal stability and electrical properties of LaErO 3 films as high- k gate dielectrics
Gao, Xu, Yin, Jiang, Xia, Yidong, Yin, Kuibo, Gao, Ligang, Guo, Hongxuan, Liu, ZhiguoVolume:
41
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/41/23/235105
Date:
December, 2008
File:
PDF, 1.00 MB
english, 2008