XEDS STEM tomography for 3D chemical characterization of...

XEDS STEM tomography for 3D chemical characterization of nanoscale particles

Genc, Arda, Kovarik, Libor, Gu, Meng, Cheng, Huikai, Plachinda, Paul, Pullan, Lee, Freitag, Bert, Wang, Chongmin
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Volume:
131
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2013.03.023
Date:
August, 2013
File:
PDF, 4.15 MB
english, 2013
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