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XEDS STEM tomography for 3D chemical characterization of nanoscale particles
Genc, Arda, Kovarik, Libor, Gu, Meng, Cheng, Huikai, Plachinda, Paul, Pullan, Lee, Freitag, Bert, Wang, ChongminVolume:
131
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2013.03.023
Date:
August, 2013
File:
PDF, 4.15 MB
english, 2013