[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Mapping Transaction Level Faults to Stuck-At Faults in Communication Hardware
Javaheri, Fatemeh, Namaki-Shoushtari, Majid, Kamranfar, Parastoo, Navabi, ZainalabedinYear:
2011
Language:
english
DOI:
10.1109/ATS.2011.94
File:
PDF, 335 KB
english, 2011