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SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Detectors, Focal Plane Arrays, and Applications - Characterization of HgCdTe epilayers grown on GaAs(211)B by molecular beam epitaxy
Chen, Shida, He, Xianzhong, Lin, Li, Frederick, William G. D., Su, Junhong, Wigdor, MarcVolume:
2894
Year:
1996
Language:
english
DOI:
10.1117/12.252113
File:
PDF, 377 KB
english, 1996