Depth profiling study on the migration of tritium in...

Journal of Nuclear Materials 1988 Vol. 160; Iss. 2-3

Depth profiling study on the migration of tritium in titanium induced by deuterium-ion bombardment

Takao Yamamoto, Shuichi Okuda, Masatoshi Fujishiro
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Volume:
160
Year:
1988
Language:
english
Pages:
6
DOI:
10.1016/0022-3115(88)90054-2
File:
PDF, 543 KB
english, 1988
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