[IEEE IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Paris, France (2006.11.6-2006.11.10)] IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Dealing with Ill Conditioning in Recursive Parameter Estimation for a Synchronous Generator
Nino, Carlos E, Velez-Reyes, MiguelYear:
2006
Language:
english
DOI:
10.1109/IECON.2006.348110
File:
PDF, 232 KB
english, 2006