[IEEE 2013 IEEE 63rd Electronic Components and Technology...

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[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Design for reliability of multi-layer thin film stretchable interconnects

Hsu, Yung-Yu, Lucas, Kylie, Davis, Dan, Ghaffari, Rooz, Elolampi, Brian, Dalal, Mitul, Work, John, Lee, Stephen, Rafferty, Conor, Dowling, Kevin
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Year:
2013
Language:
english
DOI:
10.1109/ECTC.2013.6575638
File:
PDF, 1.25 MB
english, 2013
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