Light-Ion sputtering yield measurements of Ti AND TiC under O2 exposure at high temperature
A. Santaniello, J. Appelt, J. Bohdansky, J. RothVolume:
162-164
Year:
1989
Language:
english
Pages:
6
DOI:
10.1016/0022-3115(89)90392-9
File:
PDF, 565 KB
english, 1989