Light-Ion sputtering yield measurements of Ti AND TiC under...

Light-Ion sputtering yield measurements of Ti AND TiC under O2 exposure at high temperature

A. Santaniello, J. Appelt, J. Bohdansky, J. Roth
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Volume:
162-164
Year:
1989
Language:
english
Pages:
6
DOI:
10.1016/0022-3115(89)90392-9
File:
PDF, 565 KB
english, 1989
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