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[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - Gate defects in AlGaN/GaN HEMTs revealed by low frequency noise measurements
Tartarin, J. G., Karboyan, S., Carisetti, D., Lambert, B.Year:
2013
Language:
english
DOI:
10.1109/ICNF.2013.6578987
File:
PDF, 471 KB
english, 2013