Vaporization process of SiO2 particles for slurry injection...

Journal of Analytical Atomic Spectrometry 2002 / 1 Vol. 17; Iss. 2

Vaporization process of SiO2 particles for slurry injection in inductively coupled plasma atomic emission spectrometry

Lim, H. B., Kim, T. H., Eom, S. H., Sung, Yong-ik, Moon, M. H., Lee, D. W.
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Volume:
17
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/B107941G
Date:
January, 2002
File:
PDF, 1.34 MB
english, 2002
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