Characterization of nucleation and growth of MW-CVD diamond films by spectroscopic ellipsometry and ion beam analysis methods
Pintér, I., Petrik, P., Szilágyi, E., Kátai, Sz., Deák, P.Volume:
6
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(97)00029-0
Date:
October, 1997
File:
PDF, 972 KB
english, 1997