Characterization of UF5 ultrafine particles using TEM, XPS, and XRD
J. Onoe, N. Uehara, Y. Iimura, T. Oyama, O. Suto, Y. Shimazaki, K. TakeuchiVolume:
207
Year:
1993
Language:
english
Pages:
7
DOI:
10.1016/0022-3115(93)90262-w
File:
PDF, 797 KB
english, 1993