IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2013 / 10 Vol. 32; Iss. 10
Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects
Bao, Fang, Peng, Ke, Tehranipoor, Mohammad, Chakrabarty, KrishnenduVolume:
32
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2013.2266374
Date:
October, 2013
File:
PDF, 8.01 MB
english, 2013