Depth profile analyses of implanted deuterium in tungsten...

Journal of Nuclear Materials 1995 Vol. 220-222; Iss. none

Depth profile analyses of implanted deuterium in tungsten by secondary ion mass spectrometry

K. Tokunaga, M. Takayama, T. Muroga, N. Yoshida
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Volume:
220-222
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0022-3115(94)00588-5
File:
PDF, 326 KB
english, 1995
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