Reflectivity analysis of ZnS layers grown on GaAs and Si...

Semiconductor Science and Technology 1994 / 02 Vol. 9; Iss. 2

Reflectivity analysis of ZnS layers grown on GaAs and Si substrates by metal organic vapour-phase epitaxy

Briot, O, Briot, N, Abounadi, A, Gil, B, Cloitre, T, Aulombard, R L
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Volume:
9
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/9/2/013
Date:
February, 1994
File:
PDF, 254 KB
english, 1994
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