[IEEE 2013 7th International Conference on Intelligent...

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[IEEE 2013 7th International Conference on Intelligent Systems and Control (ISCO) - Coimbatore, Tamil Nadu, India (2013.01.4-2013.01.5)] 2013 7th International Conference on Intelligent Systems and Control (ISCO) - Design and analysis of leakage current and delay for Double gate MOSFET at 45nm in CMOS technology

Manorama,, Shrivastava, Pavan, Akashe, Shyam
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Year:
2013
Language:
english
DOI:
10.1109/ISCO.2013.6481167
File:
PDF, 1.62 MB
english, 2013
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