[IEEE 2010 18th Iranian Conference on Electrical Engineering (ICEE) - Isfahan, Iran (2010.05.11-2010.05.13)] 2010 18th Iranian Conference on Electrical Engineering - Modeling of Hot Carrier induced substrate current and degradation in triple gate bulk FinFETs
Ghobadi, Nayereh, Afzali-Kusha, Ali, Asl-Soleimani, EbrahimYear:
2010
Language:
english
DOI:
10.1109/IRANIANCEE.2010.5507046
File:
PDF, 228 KB
english, 2010