Time-Resolved Temperature Measurement of AlGaN/GaN...

IEEE Electron Device Letters 2007 / 02 Vol. 28; Iss. 2

Time-Resolved Temperature Measurement of AlGaN/GaN Electronic Devices Using Micro-Raman Spectroscopy

Kuball, M., Riedel, G. J., Pomeroy, J. W., Sarua, A., Uren, M. J., Martin, T., Hilton, K. P., Maclean, J. O., Wallis, D. J.
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Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2006.889215
Date:
February, 2007
File:
PDF, 166 KB
english, 2007
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