Photoreflectance Characterization of Silicon Films on...

MRS Proceedings 1990 / 1 Vol. 188

Photoreflectance Characterization of Silicon Films on Insulator

Giordana, Adriana, Glosser, R., Pellegrino, Joseph G., Qadri, S., Twigg, M. E., Richmond, E. D., Joyner, Keith, Pollack, Gordon
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Volume:
188
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-188-349
Date:
January, 1990
File:
PDF, 316 KB
english, 1990
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