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[IEEE 2010 International Workshop on Junction Technology (IWJT) - Shanghai, China (2010.05.10-2010.05.11)] 2010 International Workshop on Junction Technology Extended Abstracts - Characterization of a body-tied vertical MOSFET
Lu, Kuan-Yu, Lin, Jyi-Tsong, Eng, Yi-Chuen, Tai, Chih-Hsuan, Chen, Cheng-Hsin, Chang, Yu-Che, Fan, Yi-HsuanYear:
2010
Language:
english
DOI:
10.1109/IWJT.2010.5474896
File:
PDF, 679 KB
english, 2010