A New Partial Reconfiguration-Based Fault-Injection System...

IEEE Transactions on Nuclear Science 2007 / 08 Vol. 54; Iss. 4

A New Partial Reconfiguration-Based Fault-Injection System to Evaluate SEU Effects in SRAM-Based FPGAs

Sterpone, L., Violante, M.
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2007.904080
Date:
August, 2007
File:
PDF, 145 KB
english, 2007
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