[IEEE 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - San Francisco, CA, USA (Feb 3-7, 2002)] 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

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