Temperature- and structural-parameters-dependent characteristics of V-band heterojunction FET MMIC DROs
Hosoya, K., Ohata, K., Inoue, T., Funabashi, M., Kuzuhara, M.Volume:
51
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2002.807848
Date:
February, 2003
File:
PDF, 564 KB
english, 2003