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[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Defect Tolerance in Nanotechnology Switches Using a Greedy Reconfiguration Algorithm
Ramsundar, S., Al-Yamani, Ahmad, Pradhan, Dhiraj K.Year:
2007
Language:
english
DOI:
10.1109/ISQED.2007.55
File:
PDF, 517 KB
english, 2007