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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - New methods in recording and reconstruction of digital holograms
Papp, Zsolt, Kornis, Janos, Gombkoto, Balazs, Osten, Wolfgang, Kujawinska, Malgorzata, Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.503361
File:
PDF, 86 KB
english, 2003