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SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise as a Tool for Studying Materials - Investigation of electromigration in copper interconnects by noise measurements
Emelianov, Vitali, Ganesan, Gopal, Puzic, Aleksandar, Schulz, Stefan, Eizenberg, Moshe, Habermeier, Hans-Ulrich, Stoll, Hermann, Weissman, Michael B., Israeloff, Nathan E., Kogan, A. ShulimVolume:
5112
Year:
2003
Language:
english
DOI:
10.1117/12.497014
File:
PDF, 438 KB
english, 2003