International, intra-national and inter-firm knowledge diffusion and technological catch-up: the USA, Japan, Korea and Taiwan in the memory chip industry
Lee, Keun, Yoon, MinhoVolume:
22
Language:
english
Journal:
Technology Analysis & Strategic Management
DOI:
10.1080/09537325.2010.488059
Date:
July, 2010
File:
PDF, 123 KB
english, 2010